Description
This standard establishes the information required by semiconductor users from IC manufacturers and distributors in order to judge whether a semiconductor component is fit for use in their particular application. It establishes a set of data elements that describes the component and defines what each element means. It does not define the quality and reliability requirements that the component must satisfy. This standard can be used in conjunction with other reliability qualification standards, such as JESD34 ‘Failure Mechanism-Driven Reliability Qualification of Silicon Devices’ and JESD47 ‘Stress Test Driven Qualification of Integrated Circuits’.
Product Details
- Published:
- 10/01/2007
- Number of Pages:
- 13
- File Size:
- 1 file , 65 KB
