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JEDEC JESD398 (R2009) PDF Download

$32.00

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
standard by JEDEC Solid State Technology Association, 07/01/1972

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Description

This standard contains a three-terminal procedure for capacitance measurement with due precautions for shielding of extraneous effects due to terminal leads and metal enclosures. Formerly known as RS-398 and/or EIA-398

Product Details

Published:
07/01/1972
Number of Pages:
14
File Size:
1 file , 420 KB