Sale!

JEDEC JESD22-A103D PDF Download

$31.00

HIGH TEMPERATURE STORAGE LIFE
standard by JEDEC Solid State Technology Association, 12/01/2010

Formats: PDF   In Stock

Category:

Description

The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state devices. The high temperature storage test is typically used to determine the effects of time and temperature, under storage conditions, for thermally activated failure mechanisms and time-to-failure distributions of solid state electronic devices, including nonvolatile memory devices (data retention failure mechanisms). Thermally activated failure mechanisms are modeled using the Arrhenius Equation for acceleration. During the test, accelerated stress temperatures are used without electrical conditions applied. This test may be destructive, depending on time, temperature and packaging (if any).

Product Details

Published:
12/01/2010
Number of Pages:
10
File Size:
1 file , 41 KB