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JEDEC JESD 22-B108A PDF Download

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COPLANARITY TEST FOR SURFACE-MOUNT SEMICONDUCTOR DEVICES
standard by JEDEC Solid State Technology Association, 01/01/2003

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Description

The purpose of this test is to measure the deviation of the terminals (leads or solder balls) from coplanarity for surface-mount semiconductor devices.

Product Details

Published:
01/01/2003
Number of Pages:
11
File Size:
1 file , 69 KB