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IEEE 1149.10-2017 PDF Download

$58.00

IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
standard by IEEE, 07/28/2017

Formats: PDF   In Stock

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Description

New IEEE Standard – Active.Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards, assembled multi-die packages, and the test of die internal circuits is defined in this standard. The circuitry includes a high-speed TAP (HSTAP) with a packet encoder/decoder and distribution architecture through which instructions and test data are communicated. The standard leverages the languages of IEEE Std 1149.1?????? to describe and operate the on-chip circuits.

Product Details

Published:
07/28/2017
ISBN(s):
9781504439954, 9781504439961, 9781504442213
Number of Pages:
96
File Size:
1 file , 3.4 MB
Product Code(s):
STD22564, STDPD22564, STDPL22564